ABSTRACT
We report on a numerical study of the potential profile and energy states of lateral p–n junctions at the GaAs/AlGaAs interface. The junctions arise from the amphoteric nature of Si doping during molecular‐beam epitaxial growth on {100} versus {111} surfaces and have been previously realized experimentally through selective chemical etching. We find that the occurrence of a lateral p–n junction is sensitive to the doping of the overlayer and for Si doping concentrations less than 5 × 1017 cm−3 in Al0.3Ga0.7As, the p–n junction vanishes. We have studied the formation of a quantum wire in a V‐groove structure and show that a one‐dimensional system is in fact formed which may be controlled by the reverse bias applied between the n and p regions.
Article Metrics
Views
2
Citations
Crossref
0
Web of Science
ISI
0
Altmetric
Please Note: The number of views represents the full text views from December 2016 to date. Article views prior to December 2016 are not included.

